Dr. Floyd D. McDaniel, Regent's Professor & Chair
 
 
  Department of Physics
P.O. Box 311427
Denton, Texas  76203-1427
(940) 565-2630
Physics Building, Room 110
mcdaniel@unt.edu
 
   
Education:  

Ph.D., Georgia, 1971
Nuclear physics; ion-atom interactions

Research:   Dr. McDaniel directs the Ion Beam Modification and Analysis Laboratory (IBMAL), and is actively pursuing research in atomic/molecular physics and materials analysis. He is the coordinator of the Trace Element Accelerator Mass Spectroscopy Project. The IBMAL contains five electrostatic accelerators with potentials from 200KV to a 3 MV tandem accelerator.
Patent Disclosures, Filed
  1. "Multiple target, multiple energy radioisotope production," I.L. Morgan, F.D. McDaniel, P. Grande, and J.M. Watson, Serial Number 60/107,238, (1999).
 
  2. "Water cooled target assembly with removable target plate," F.D. McDaniel, R. Damm, H. Hupf, J. Beaver, and I.L. Morgan, (1999).
 
  3. "Local modular target shielding," I.L. Morgan and F.D. McDaniel, (1999).
 
  4. "Thin vacuum valve for particle accelerator beam line," F.D. McDaniel, J.M. Potter, and Gan Li, Serial Number 09/432,278 (1999).
 
Books and Book Chapters
  1. Advanced Experiments in Nuclear Science, Volume 1, Advanced Nuclear Physics and Chemistry Experiments, Jerome L. Duggan, Floyd D. McDaniel, and Jack G. Hehn (North Texas State University, Denton, 1976).
 
  2. "High Energy Ion Beam Analysis," B.L. Doyle and F.D. McDaniel, in Methods in Materials Research, Unit 12a, Ed. by Elton Kaufmann (John Wiley and Sons, NY, 2001) pp. 12a.1-12a.4.
 
  3. "Trace Element Accelerator Mass Spectrometry," F.D. McDaniel, in Methods in Materials Research, Unit 12a5, Ed. by Elton Kaufmann (John Wiley and Sons, NY, 2001) pp. 12a.5.1-12a.5.26.
 
  4. Proceedings of the Sixteenth International Conference on Ion Beam Analysis, Albuquerque, NM, USA, June 29-July 4, 2003, Published in Nucl. Instrum. And Methods in Physics Research B219-220 (2004) pp. 1-1061, Edited by G. Vizkelethy, F.D. McDaniel, S. Thuvuthasan, and J.R. Tessmer (Elsevier, The Netherlands, 2004).
 
  5. Proceedings in the Eighteenth International Conference on the Application of Accelerators in Research and Industry, Fort Worth, TX, USA, October 10-15, 2004, Published in Nucl. Instrum. And Methods in Physics Research B241 (2005) pp. 1-1038, Edited by Floyd Del McDaniel, Barney L. Doyle, Gyorgy Vizkelethy, Brant M. Johnson and Janet M. Sisterson (Elsevier, The Netherlands, 2004).
 
  6. Proceedings of the Nineteenth International Conference on the Application of Accelerators in Research and Industry, Fort Worth, TX, USA, August 20-25, 2006 Published in Nucl. Instrum. And Methods in Physics Research B_(2007) pp. 1-_, Edited by Floyd Del McDaniel, Barney L. Doyle, Itzik Ben-Itzhak, Robert W. Hamm, Brant M. Johnson, Janet M. Sisterson, Dennis R. Slaughter, Suntharampillai Thevuthasan (Elsevier, The Netherlands, 2007).
 
Invited Publications, Refereed:
  1. "K‑Shell x‑rays from Ti, Ni, Ge, and Rb for Incident Ions from 1H to 35Cl in the Energy Range from 1‑3 MeV/amu," F.D. McDaniel and J.L. Duggan, Fourth International Conference on Beam Foil Spectroscopy and Heavy Ion Atomic Physics, Gatlinburg, Tennessee, September 15‑19, 1976, edited by I. Sellin and D. Pegg, (Plenum Press, N.Y. 1976), Vol. 2, p. 519.
 
  2. "X‑Ray Cross Section in Ion‑Atom Collisions," F.D. McDaniel, Fourth International Conference on the Application of Small Accelerators, Denton, Texas, October 25‑27, 1976, edited by J.L. Duggan and I.L. Morgan (IEEE Transactions on Nuclear Science, N.Y., 1977), p. 52.
 
  3. "Direct Ionization and Electron Capture in Inner‑Shell Processes," F.D. McDaniel, International Workshop on Cross Sections for Fusion and Other Applications, Texas A&M University, College Station, Texas, Edited by John Reading, (Nucl. Instrum. and Methods 214, 57 (1983).
 
  4. "Top Silicon Layer of SOI Formed by Oxygen Ion Implantation," R.F. Pinizzotto, B.L. Vaandrager, S. Matteson, H.W. Lam, S.D.S. Malhi, A.H. Hamdi, and F.D. McDaniel, Proceedings of the Seventh International Conference on the Application of Accelerators in Research and Industry, Denton, Texas, November 8-10, 1982, IEEE Trans. on Nucl. Sci. NS-30, 1718 (1983).
 
  5. "Carbon K‑Shell Vacancy Production and K‑K Electron Capture Cross Sections for 0.4 to 1.5 eq \O() H+ Ions Incident on CH4 Targets," F.D. McDaniel, A. Toten, R.P. Bhalla, and G. Lapicki, Proceedings of the Second International Workshop on Cross Sections for Fusion and Other Applications, College Station, Texas, November 8-10, 1984, Nucl. Instrum. and Methods in Physics Research, A240, 492 (1985).
 
  6. "Molecular Effects in Carbon K-Shell Auger-Electron Production by 0.6 -2.0 MeV Protons and Extraction of an Atomic Cross Section," F.D. McDaniel and G. Lapicki, Proceedings of the Third International Workshop on Cross Sections for Fusion and Other Appications, College Station, Texas, November 6-8, 1986, Nucl. Instrum. and Methods in Physics Research B27, 500 (1987).
 
  7. "K-, L-, and M-Shell X-Ray Production Cross Sections for Selected Elements in Collisions with Few Electron Ions," F.D. McDaniel, J.L. Duggan, P.D. Miller, and G. Lapicki, Proceedings of the Study Conference on Spectroscopy and Collisions of Few Electron Ions, Bucharest, Romania, August 29-Sept. 2, 1988, Ed. by M. Ivascu, V. Florescu, and V. Zoran (World Scientific Publishing Co., NJ, 1989) p. 199.
 
  8. "Charge State Dependence of K X-Ray Production in Thin Targets by Multi-Charged Silicon Ions," F.D. McDaniel, J.L. Duggan, G. Lapicki, and P.D. Miller, Proceedings of the Fourth International Workshop on Cross Sections for Fusion and Other Applications, College Station, Texas, November 3-5, 1988, Nucl. Instrum. and Methods in Physics Research B42, 485 (1989).
 
  9. "The University of North Texas Ion Beam Modification and Analysis Laboratory,"  J.L. Duggan, F.D. McDaniel, S. Matteson, D.E. Golden, J.M. Anthony, B. Gnade, and J.A. Keenan, Proceedings of the Tenth International Conference on the Application of Accelerators in Research and Industry, Denton, Texas, November 7-9, 1988, Nucl. Instrum. and Methods in Physics Research B40/41, 709 (1989).
 
  10. "Applications of Accelerator Mass Spectrometry to Electronic Materials," J.M. Anthony, S. Matteson, D.K. Marble, J.L. Duggan, F.D. McDaniel, and D.J. Donahue, Proceedings of the First European Conference on the Application of Accelerators in Applied Research and Technology, Frankfurt, FRG, September 4-9, 1989, Ed. by K. Bethge, F. Rauch, and P. Misaelides, Nucl. Instrum. and Methods in Physics Research B50, 262 (1990).
 
  11. "X-Ray Production in Fluorine by Highly Charged Boron, Carbon, and Oxygen Ions," F.D. McDaniel, D.K. Marble, J.L. Duggan, M.R. McNeir, Y.C. Yu, D.L. Weathers, P.S. Elliott, R.M. Wheeler, R.P. Chaturvedi, and G. Lapicki, Proceedings of the Joint U.S.-Japan Seminar on Dynamical Excitations by Highly Charged Ions, Anchorage, Alaska, June 18-22, 1990, Nucl. Instrum. and Methods in Physics Research B53, 531 (1991).
 
  12. "Ion Beam Techniques for Materials Modification and Analysis," F.D. McDaniel, D.L. Weathers, J.L. Duggan, S. Matteson, and D.K. Marble, Proceedings of the Second International Conference on Applications of Nuclear Techniques, Heraklio, Crete, Greece, June 24-30, 1990, Ed. by George Vourvopoulos and Themis Paradellis (World Scientific Publishing Co., N.J., 1991) p. 307.
 
  13. "Analysis and Reduction of Low-Z Contaminants on Thin Carbon Films," D.L. Weathers, J.L. Duggan, R.B. Escue, and F.D. McDaniel, Proceedings of the 15th World Conference of the International Nuclear Target Development Society, Santa Fe, NM, September 10-14, 1990, Nucl. Instrum. and Methods in Physics Research A303, 69 (1991).
 
  14. "Materials Characterization Using Accelerator Mass Spectrometry," J.M. Anthony, R.L. Beavers, T.J. Bennett, S. Matteson, D.K. Marble, D.L. Weathers, F.D. McDaniel, and J.L. Duggan, Proceedings of the Eleventh International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 5-8, 1990, Ed. by J.L. Duggan and I.L. Morgan, Nucl. Instrum. and Methods in Physics Research B56/57, 873 (1991).
 
  15. "Radionuclide Dating and Trace Element Analysis by Accelerator Mass Spectrometry," F.D. McDaniel, S. Matteson, D.L. Weathers, J.L. Duggan, D.K. Marble, I. Hassan, Z.Y. Zhao, and J.M. Anthony, Proceedings of the Second International Conference on Methods and Applications of Radioanalytical Chemistry, Kona, Hawaii, April 21-27, 1991.  Journal of Radioanalytical and Nuclear Chemistry 160, 119 (1992).
 
  16. "Trace Element Analysis by Accelerator Mass Spectrometry," F.D. McDaniel, S. Matteson, J.M. Anthony, D.L. Weathers, J.L. Duggan, D.K. Marble, I. Hassan, Z.Y. Zhao, A.M. Arrale, and Y.D. Kim, Proceedings of the Eighth International Conference on Modern Trends in Activation Analysis, Vienna, Austria, September 16-20, 1991.  Journal of Radioanalytical and Nuclear Chemistry 167, 423 (1993).
 
  17. "Characterization of Electronic Materials Using Accelerator Mass Spectrometry," F.D. McDaniel, J.M. Anthony, S. Matteson, D.L. Weathers, J.F. Kirchhoff, G. Vizkelethy, D.K. Marble, Y.D. Kim, I. Hassan, Z.Y. Zhao, Proceedings of the Third International Conference on Nuclear Techniques for Analytical and Industrial Applications, Mykonos, Greece, June 6-13, 1992.  Ed. by George Vourvopoulos and Themis Paradellis (Western Kentucky University, USA, 1993) p. 179.
 
  18. "L-Shell X-Ray Production Cross Sections for 29Cu, 31Ga, 32Ge, 35Br, 39Y, 60Nd, 67Ho, 70Yb, 79Au, and 82Bi for 2-25 MeV Carbon Ions," R. Mehta, J.L. Duggan, F.D. McDaniel, M.R. McNeir, Y.C. Yu, D.K. Marble, and G. Lapicki, Proceedings of the Twelfth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 2-5, 1992, Ed. by J.L. Duggan and I.L. Morgan, Nucl. Instrum. and Methods in Physics Research B79, 175 (1993).
 
  19. "Impurity Determination in Electronic Materials by Accelerator Mass Spectrometry," F.D. McDaniel, J.M. Anthony, J.F. Kirchhoff, D.K. Marble, Y.D. Kim, S.N. Renfrow, E.C. Grannan, E.R. Reznik, G. Vizkelethy, and S. Matteson, Third European Conference on Accelerators in Applied Research and Technology, Orleans, France, August 31-September 4, 1993, Nucl. Instrum. and Methods in Physics Research B89, 242 (1994).
 
  20. "Improved Trace Impurity Characterization in the Electronics Materials Industry by Accelerator Mass Spectrometry," F.D. McDaniel, J.M. Anthony, J.F. Kirchhoff, D.K. Marble, Y.D. Kim, S.N. Renfrow, and S. Matteson, '93 Inter. Symp. on High-Tech Industries and Products (HIPIS'93) Shanghai, China, Nov. 9-12, 1993.  Addendum to Proceedings.
 
  21. "Molecular free SIMS for semiconductors," J.M. Anthony, F.D. McDaniel, and S. Renfrow, Published in Diagnostic Techniques for Semiconductor Materials and Devices 1994, Ed. by D.K. Schroder, J.L. Benton, and P. Rai-Choudhury, Proceedings of the Electrochemical Society, Inc., 186th Meeting, Miami Beach, FL, October 9-14, 1994, Vol. 94-33 (1994) pp. 349-354.
 
  22. "Depth profiling analysis of semiconductor materials by accelerator mass spectrometry," F.D. McDaniel, J.M. Anthony, S.N. Renfrow, Y.D. Kim, S.A. Datar, and S. Matteson, Thirteenth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 7-10, 1994.  Nucl. Instrum. and Meth. B99, 537-540 (1995).
 
  23. "Correlation between energy loss and ion-induced electron emission of 1 MeV protons channeled along the <100> axis of a thin silicon crystal," Z.Y. Zhao, A.M. Arrale, S.L. Li, F.D. McDaniel, S. Matteson, D.L. Weathers, J.M. Anthony, and B. Gnade, Thirteenth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 7-10, 1994.  Nucl. Instrum. and Meth. B99, 30-34 (1995).
 
  24. "An overview of projectile-charge-state dependence of K-, L-, and M-shell ionization in thin solid targets for a variety of incident heavy ions from 0.1 to 5.7 MeV/u," H.L. Sun, J.L. Duggan, F.D. McDaniel, and G. Lapicki, Thirteenth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 7-10, 1994.  Nucl. Instrum. and Meth. B99, 192-197 (1995).
 
  25. "Collision-induced interaction cross sections of 1-7 MeV B2 ions incident on an N2 gas target," Y.D. Kim, J.Y. Jin, S. Matteson, D.L. Weathers, J.M. Anthony, P. Marshall, and F.D. McDaniel, Thirteenth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 7-10, 1994.  Nucl. Instrum. and Meth. B99, 82-85 (1995).
 
  26. "Fast neutron production of radioisotopes," F.D. McDaniel, W.J. Courtney, W.W. Givens, W.B. Cloud, B.L. Freeman, I.L. Morgan, and R.R. Schafer, Proceedings of the Fourth International Conference on Application of Nuclear Techniques: Neutrons and Their Applications, Crete, Greece, June 12-18, 1994.  SPIE The Inter. Soc. for Optical Eng., Vol. 2339, 529-534 (1995).
 
  27. "Applications of a neutron-producing dense plasma focus," F.D. McDaniel, B.L. Freeman, and C.M. Fowler, Fifth International Conference on Application of Nuclear Techniques: Neutrons in Research and Industry, Crete, Greece, June 9-15, 1996, SPIE The Inter. Soc. For Optical Eng., Vol 2867, 517-520 (1997).
 
  28. "Convolution fitting and deconvolution methods for fluorine depth profiling by resonant NRA," J. Jin, D.L. Weathers, J.P. Biscar, B.F. Hughes, J.L. Duggan, F.D. McDaniel, and S. Matteson, Fourteenth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 6-9, 1996, AIP Conf. Proc. 392, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1997) pp. 681-684.
 
  29. "High sensitivity impurity measurements in semiconductors using trace-element accelerator mass spectroscopy (TEAMS)," S.A. Datar, Z.Y. Zhao, S.N. Renfrow, B.N. Guo, J.M. Anthony, and F.D. McDaniel, Fourteenth International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 6-9, 1996, AIP Conf. Proc. 392, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1997) pp. 815-818.
 
  30. "A method to reduce molecular interferences in SIMS: trace element accelerator mass spectrometry (TEAMS)," F.D. McDaniel, S.A. Datar, B.N. Guo, S.N. Renfrow, S. Matteson, V.I. Zoran, Z.Y. Zhao, and J.M. Anthony, 11th Inter. Conf. On Secondary Ion Mass Spectrometry, Orlando, FL, Sept. 7-12, 1997, Proc. Of SIMS XI, ed. by G. Gillen, R. Lareau, J. Bennett, and F. Stevie (John Wiley & Sons, U.K., 1998) pp. 167-170.
 
  31.

"A nuclear reaction analysis study of fluorine uptake in flint," J.-Y. Jin, D.L. Weathers, F. Picton, B.F. Hughes,  J.L. Duggan, F.D. McDaniel, and S. Matteson, 15th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 4-7, 1998, AIP Conf. Proc. CP-475, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1999) pp. 554-557.
 

  32. "Molecular dissociation in dilute gas," S.N. Renfrow, J.L. Duggan, and F.D. McDaniel, 15th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 4-7, 1998, AIP Conf. Proc. CP-475, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1999) pp. 200-203.
 
  33. "Ion beam induced charge collection (IBICC) from integrated circuit test structures using a 10 MeV carbon microbeam," B.N. Guo, S.N. Renfrow, B.L. Doyle, D.S. Walsh, T.J. Aton, M. El Bouanani, J.L. Duggan, and F.D. McDaniel, 15th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 4-7, 1998, AIP Conf. Proc. CP-475, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1999) pp. 1121-1124.
 
  34. "Ion induced electron emission from Si and photoresist surfaces," Z.Y. Zhao, J.J. Xu, B.N. Guo, A.M., Arrale, S.N. Renfrow, S. Metha, and F.D. McDaniel, 15th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 4-7, 1998, AIP Conf. Proc. CP-475, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1999) pp. 810-813.
 
  35. "Materials analysis using trace element accelerator mass spectrometry (TEAMS)," S.A. Datar, S.N. Renfrow, B.N. Guo, and F.D. McDaniel, 15th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 4-7, 1998, AIP Conf. Proc. CP-475, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 1999) pp. 632-635.
 
  36. "Heavy ion microbeam studies of diffusion time resolved charge collection from p-n junctions," B.N. Guo, M. El Bouanani, S.N. Renfrow, D.S. Walsh, B.L. Doyle,  J.L. Duggan, and F.D. McDaniel, 16th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 1-4, 2000, AIP Conf. Proc. CP-576, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2001) pp. 531-534.
 
  37. "The recent progress of the high-energy heavy-ion nuclear microprobe at the University of North Texas," C. Yang, B.N. Guo, M. El Bouanani, M. Nigam, J.L. Duggan, and F.D. McDaniel, 16th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 1-4, 2000, AIP Conf. Proc. CP-576, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2001) pp. 539-542.
 
  38. "The study of phosphor efficiency and homogeneity using a nuclear microprobe," C. Yang, B.L. Doyle, M. Nigam, M. El Bouanani, J.L. Duggan, and F.D. McDaniel, 16th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 1-4, 2000, AIP Conf. Proc. CP-576, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2001) pp. 535-538.
 
  39. "Stopping powers of 2-10 MeV Si, P, and S ions in Ni, Cu, and Ge thin films using a novel ERD-based technique," M. Nigam, J.L. Duggan, M. El Bouanani, C. Yang, S.A. Datar, S. Matteson, and F.D. McDaniel, 16th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 1-4, 2000, AIP Conf. Proc. CP-576, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2001) pp. 25-28.
 
  40. "Production of 90Y by the 90Zr(n,p)90Y nuclear reaction using neutrons produced from a variable energy cyclotron, D. Necsoiu, I.L. Morgan, H. Hupf, J. Armbruster, D. Boyce, M. El Bouanani, and F.D. McDaniel, 16th Inter. Conf. on the Applic. of Accelerators in Research and Industry, Denton, TX, November 1-4, 2000, AIP Conf. Proc. CP-576, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2001) pp. 335-338.
 
  41. "Ionoluminescence decay measured with single ions," F.D. McDaniel, B.L. Doyle, C.H. Seager, D.S. Walsh, G. Vizkelethy, D.K. Brice, C. Yang, P. Rossi, M. Nigam, M. El Bouanani, G.V. Ravi Prasad, J.C. Schwartz, L.T. Mitchell, and J.L. Duggan, Proc. Of the 15th Inter. Conf. On Ion Beam Analysis, Cairns, Australia, July 15-20, 2001, Nucl. Instr. and Methods B190, (2002) 1-10.
 
  42. "Charge collection in SOI capacitors and circuits and its effect on SEU hardness," J.R. Schwank, P.E. Dodd, M.R. Schaneyfelt, G. Vizkelethy, B.L. Draper, T.A. Hill, D.S. Walsh, G.L. Hash, B.L. Doyle, and F.D. McDaniel, IEEE Trans. Nucl. Sci 49 (2002) 2937-2947.
 
  43. "Ion microbeam studies of speleothems in stalagmites from Slovenian Karst," P. Pelicon, Kavčič, M. Budnar, J. Simčič, Ž. Šmit, A. Mihevc, J.L. Duggan, and F.D. McDaniel, Fourth Inter. Conf. On BioPIXE, Mexico City, MX, April 15-19, 2002,  Inter. J. of PIXE Vol. 12 (2003) 181-188.
 
  44. "The ion-electron emission microscope for radiation effects microscopy for ICs," G. Vizkelethy, B.L. Doyle, F.D. McDaniel, P. Rossi, and P.E. Dodd, 13th Biannual Single Event Effects Symposium, Manhattan Beach, CA, April 23-25, 2002. Session E: Testing and Facilities, paper E4, Published electronically (2002).
 
  45.

"Ion-Induced Emission Microscopies,"  B.L. Doyle, D.S. Walsh, G. Vizkelethy, P. Rossi, F.D. McDaniel, T. Schenkel, J. McDonald, and A.V. Hamza, 2nd International Workshop on Ion Beam Techniques for the Analysis of Composition and Structure with Single Atomic Resolution, Kyongju, South Korea, Sept. 24-27, 2002.  Current Applied Physics by Elsevier 3 (2003) 31-34.
 

  46. "High LET single event upset cross sections for bulk and SOI CMOS SRAMs," F.D. McDaniel, B.L. Doyle, G. Vizkelethy, P.E. Dodd, and P. Rossi, 17th International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 12-16, 2002. AIP Conf. Proc. 680, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2003) pp 355-358.
 
  47. "The tandem-RFQ linac booster at Sandia National Laboratories," F.D. McDaniel, B.L. Doyle, P. Rossi, D.L. Buller, R.W. Hamm, and H. Schone 17th International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 12-16, 2002. AIP Conf. Proc. 680, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2003) pp 986-990.
 
  48. "Single cell irradiation nuclear microscopy using a radioactive source," P. Rossi, B.L. Doyle, J.C. Banks, A. Battistella, G. Gennaro, F.D. McDaniel, M. Mellon, E. Vittone, G. Vizkelethy, and N.D. Wing, 17th International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 12-16, 2002. AIP Conf. Proc. 680, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2003) pp 364-368.
 
  49. "Depth profiles of Mg, Si, and Zn implants in GaN by trace element accelerator mass spectrometry," G.V. Ravi Prasad, P. Pelicon, L.J. Mitchell, and F.D. McDaniel, 17th International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 12-16, 2002. AIP Conf. Proc. 680, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2003)  pp 369-372.
 
  50. "Dose measurements of ultra-shallow implanted arsenic and boron in Si by RBS and ERDA," P. Pelicon, G.V. Ravi Prasad, M. El Bouanani, B.N. Guo, D. Birt, J.L. Duggan, and F.D. McDaniel, 17th International Conference on the Application of Accelerators in Research and Industry, Denton, TX, November 12-16, 2002. AIP Conf. Proc. 680, AIP Press, Ed. by J.L. Duggan and I.L. Morgan (Amer. Instit. of Physics, Woodbury, NY, 2003) pp 482-486.
 
  51. "Detection of trace impurities in electronic materials by accelerator mass spectrometry," F.D. McDaniel, G.V. Ravi Prasad, P. Pelicon, and L.J. Mitchell, Proceedings of the ISMAS Silver Jubilee Symposium on Mass Spectrometry, Edited by S.K. Aggarwal (Indian Society for Mass Spectrometry (ISMAS) Mumbai, India, 2003) pp 247-258.
 
  52. text-indent:-.5in"> "Ion beam induced luminescence of doped yttrium compounds," P. Rossi, D.K. Brice, C.H. Seager, F.D. McDaniel, G. Vizkelethy, and B.L. Doyle, Proc. Of the 16th Inter. Conf. On Ion Beam Analysis, Albuquerque, NM, June 29-July 4, 2003, Nucl. Instrum. and Methods in Physics Research B219-220 ( 2004) 327-332.
 
  53. "Radiation effects microscopy of SOI SRAMs," B.L. Doyle, K.M. Horn, P.E. Dodd, F.D. McDaniel, D.S. Walsh, P. Rossi, and G. Vizkelethy, Proceedings of the First InternationalSymposium on Radiation Physics, Mexico City,  Mexico, December 1-3, 2003.  Edited by Guillerma Espinosa G. and Arturo Sanchez y G.  (Universidad Nacional Autonoma de Mexico, Mexico City, 2004) pp. 39-49.  (Invited Plenary talk).
 
  54. "Radiation effects of high-energy, heavy-ions in semiconductor devices," F.D. McDaniel, B.L. Doyle, G. Vizkelethy, D.L. Buller, and P. Rossi, Proceedings of the First InternationalSymposium on Radiation Physics, Mexico City, Mexico, December 1-3, 2003.  Edited by Guillerma Espinosa G. and Arturo Sanchez y G.  (Universidad Nacional Autonoma de Mexico, Mexico City, 2004) pp. 23-38.  (Invited Plenary talk).
 
  55. "Gallium arsenide (GaAs) and lead zirconate titanate (PZT) in a microwave field," A. Anand, J.A. Roberts, F.D. McDaniel, J.N. Dahiya, and M. Al-Share, Proc. Of the 10th Inter. Symposium on Microwave and Optical Technology (ISMOT 2005), August 22-25, 2005, Fukuoka, Japan, Submitted for publication.
 
  56. "Measurements and calculations of M-shell X-ray production in Er, Yb, and Lu by 0.75-6.0 MeV helium ions," F. Naab, J.L. Duggan, O.W. Holland, F.D. McDaniel, G. Lapicki, 18th Inter. Conf. On the Application of Accelerators in Research and Industry, October 10-15, 2004, Ft. Worth, TX, Nucl. Instrum. and Methods in Physics Research B241 ( 2005) 94-100.
 
  57. "Select gas absorption in carbon nanotubes loading a resonant cavity to sense airborne toxin gases," A. Anand, J.A. Roberts, F. Naab, J.N. Dahiya, O.W. Holland, F.D. McDaniel, 18th Inter. Conf. On the Application of Accelerators in Research and Industry, October 10-15, 2004, Ft. Worth, TX, Nucl. Instrum. and Methods in Physics Research B241 (2005) 511-516.
 
  58. "A LabVIEW-based expandable modular control system with a layered-structure for a 3 MV tandem accelerator," W. Xu, F.D. McDaniel, 18th Inter. Conf. On the Application of Accelerators in Research and Industry, October 10-15, 2004, Ft. Worth, TX, Nucl. Instrum. and Methods in Physics Research B241 ( 2005) 890-895.
 
  59. "Formation of optically-active, metal silicides using ion implantation and/or oxidation," L.J. Mitchell, O.W. Holland, K. Hossain, E.B. Smith, T.D. Golden, J.L. Duggan, F.D. McDaniel, 18th Inter. Conf. On the Application of Accelerators in Research and Industry, October 10-15, 2004, Ft. Worth, TX, Nucl. Instrum. and Methods in Physics Research B241 ( 2005) 548-552.
 
  60. "Low-energy ion irradiation effects on hydrogen absorption and desorption in carbon nanotubes," F. D. McDaniel, F. U. Naab, O. W. Holland, M. Doubhadel, L. J. Mitchell, and J. L. Duggan, 18th Inter. Conf. On Surface Modification of Materials by Ion Beams, September 4-9, 2005, Kusadasi, Turkey, Surface and Coatings Technology 201 (2007) 8564-8567.
 
Refereed Journals:    
  61. "Proton Spin Flip in the Microscopic Distorted Wave Approximation," F.D. McDaniel and K.A. Amos, Nuc. Phys. A180, 497 (1972).
 
  62. "Spin‑Flip Probability in the Inelastic Scattering of 7.5 MeV Neutrons from the 4.43 MeV State of 12C," F.D. McDaniel, M.W. McDonald, M.F. Steuer, and R.M. Wood, Phys. Rev. C7, 1181 (1972).
 
  63. "Spin‑Flip Probability for 7.46 MeV Neutrons Scattered Inelastically (Q = ‑1.78 MeV) by a Silicon Target," M.F. Steuer, R.M. Wood, M.W. McDonald, F.D. McDaniel, and  M.P. Etton, Phys. Rev. C7, 2304 (1973).
 
  64. "A Fast Neutron Polarimeter with Carbon Analyzer and Pulse Shape Discrimination," J.E. Sherwood, F.D. McDaniel, and M.T. McEllistrem, Nucl. Instrum. and Methods 107, 317 (1973).
 
  65. "Elastic and Inelastic Scattering of 1.5 MeV Neutrons by the Even‑A Isotopes of Zirconium and Molybdenum," F.D. McDaniel, J.D. Brandenberger, G.P. Glasgow, and H.G. Leighton, Phys. Rev. C10, 1087 (1974).
 
  66. "Nuclear Lifetimes of States in 94Tc and 96Tc via the Pulsed‑Beam, Direct‑Timing Technique," F.D. McDaniel and F.D. Snyder, Phys. Rev. C10, 1124 (1974).
 
  67. "K‑Shell X‑Ray Production Cross Sections for Selected Elements from Ti to Y for 0.5 to 2.5 MeV Alpha Particle Bombardment," F.D. McDaniel, Tom J. Gray, and R.K. Gardner, Phys. Rev. A11, 1607 (1975).
 
  68. "K‑Shell X‑Ray Production Cross Sections of Selected Elements Ti to Sb for l.0 to 5.0 MeV/amu 7Li Ions," F.D. McDaniel, Tom J. Gray, R.K. Gardner, G.M. Light, J.L. Duggan, H.A. Van Rinsvelt, R.D. Lear, G.H. Pepper, J. William Nelson, and Arlen R. Zander, Phys. Rev. A12, 1271 (1975).
 
  69. "Effect of Nuclear Deformation on Neutron Elastic Scattering," Ch. Lagrange, R.E. Shamu, T. Burrows, G.P. Glasgow, G. Hardie, and F.D. McDaniel, Phys. Lett. 58B, 293 (1975).
 
  70. "L‑Shell X‑Ray Production Cross Sections for Light Ions on Sm, Yb, and Pb," Tom J. Gray, G.M. Light, R.K. Gardner, and F.D. McDaniel, Phys. Rev. A13,  2393 (1975).
 
  71. "A New Method of Absolute Neutron Flux Determination Using an Associated Gamma‑Ray Technique," J.D. Brandenberger, F.D. Synder, J.D. Dawson, T.W. Burrows, and F.D. McDaniel, Nucl. Instrum. Methods 138, 321 (1976).
 
  72. "K‑Shell Ionization of Elements Ca to Zn for 0.5‑2.5 MeV/amu 14N Ion Impact,"  F.D. McDaniel, J.L. Duggan, P.D. Miller, and G.D. Alton, Phys. Rev. A15, 846 (1977); A16, 2198 (1977).
 
  73. "K‑Shell X‑Ray Production in Ge, Rb, Y, Zr and Ag by 14N Ion Impact," J. Tricomi, J.L. Duggan, F.D. McDaniel, P.D. Miller, R.P. Chaturvedi, R.M. Wheeler, J. Lin, K.A. Kuenhold, L.A. Rayburn, and S.J. Cipolla, Phys. Rev. A15, 2269 (1977).
 
  74. "K‑Shell X‑Rays of Selected Elements from Nb through Gd for Incident Protons and Alpha Particles from 0.6 to 2.4 MeV," S.R. Wilson, F.D. McDaniel, J.R. Rowe, and J.L. Duggan, Phys. Rev. A16, 903 (1977).
 
  75. "Projectile Charge‑State Dependence of K‑Shell Ionization by Silicon Ions: A Comparison of Coulomb Ionization theories for Direct Ionization and Electron Capture with X‑Ray Production Data," F.D. McDaniel, J.L. Duggan, G. Basbas,  P.D. Miller, and G. Lapicki, Phys. Rev. A16, 1375 (1977).
 
  76. "Extended Tables for Plane‑Wave Born Approximation Calculation of Direct Coulomb Ionization of the K‑Shell by Charged Particles," R. Rice, G. Basbas, and F.D. McDaniel, Atomic Data Nuclear Data Tables 20, 503 (1977).
 
  77. "K‑Shell Ionization of Elements 15P to 28Ni for 0.4 to 3.8 MeV/amu 10B‑Ion Bombardment," G. Monigold, F.D. McDaniel, J.L. Duggan, R. Rice, A. Toten, R. Mehta, and P.D. Miller, Phys. Rev. A18, 380 (1978).
 
  78. "Level and Decay Scheme Studies in 92Zr and 94Zr via (n,n'γ) Reactions," G.P. Glasgow, F.D. McDaniel, J.L. Weil, J.D. Brandenberger, and M.T. McEllistrem, Phys. Rev. C18, 2520 (1978).
 
  79. "K‑Shell Ionization of Elements 29Cu to 37Rb for 0.4‑3.8 MeV/amu 1 eq \O()B Ion Bombardment," R. Mehta, F.D. McDaniel, J.L. Duggan, and P.D. Miller, Phys. Rev. A19, 1363 (1979).
 
  80. "Projectile Charge State Dependence of Target L‑Shell Ionization by 1.86 MeV/amu Flourine and Silicon Ions and 1.8 MeV/amu Chlorine Ions," F.D. McDaniel, A. Toten, R.S. Peterson, J.L. Duggan, S.R. Wilson, J.D. Gressett, P.D. Miller, and G. Lapicki, Phys. Rev. A19, 1517 (1979).
 
  81. "Nonrelativistic Plane‑Wave Born‑Approximation Calculations of Direct Coulomb M‑Subshell Ionization by Charged Particles," D.E. Johnson, G. Basbas, and F.D. McDaniel, Atomic Data and Nuclear Data Tables 24, 1 (1979).
 
  82. "Electron Capture from K‑Shells by Fully Stripped Ions," G. Lapicki and F.D. McDaniel, Phys. Rev. A22, 1896 (1980); A23, 975 (1981).
 
  83. "K‑Shell Ionization by Low Velocity Ions," R.K. Rice, F.D. McDaniel, G. Basbas, and J.L. Duggan, Phys. Rev. A24, 758 (1981).
 
  84. "M‑Shell X‑Ray Production Cross Sections in Thin targets of 79Au, 82Pb, 83Bi, and 92U by 0.3 ‑ 2.6 MeV eq \O() H+ and eq \O() He+ Ions," R. Mehta, J.L. Duggan, J.L. Price, F.D. McDaniel, and G. Lapicki, Phys. Rev. A26, 1883 (1982).
 
  85. "Rapid Isothermal Annealing of 75As Implanted Silicon," S.R. Wilson, R. B. Gregory, W.M. Paulson, A.H. Hamdi, and F.D. McDaniel, Applied Physics Letters 41, 978 (1982).
 
  86. "Thermal Annealing Behavior of an Oxide Layer Under Silicon," A.H. Hamdi, F.D. McDaniel, R.F. Pinizzotto, S. Matteson, H.W. Lam, and S.D.S. Malhi, Applied Physics Letters, 41, 1143 (1982).
 
  87. "Direct Ionization and Electron Capture in M‑shell X‑ray Production by Fluorine Ions," R. Mehta, J.L. Duggan, F.D. McDaniel, M.C. Andrews, G. Lapicki, P.D. Miller,  L. A. Rayburn, A.R. Zander, Phys. Rev. A28, 2722 (1983).
 
  88. "1H+ and 4He+ Induced M‑Shell X‑Ray Production cross Sections for Selected Elements in the Rare Earth Region," R. Mehta, J.L. Duggan, J.L. Price, P.M. Kocur, F.D. McDaniel, G. Lapicki, Phys. Rev. A28, 3217 (1983).
 
  89. "Rapid Isothermal Annealing of As‑, P‑, and B‑Implanted Silicon," S.R. Wilson, W.M. Paulson, R.B. Gregory, A.H. Hamdi, F.D. McDaniel, Journal of Applied Physics 55, 4162 (1984).
 
  90. "Fast Diffusion of As in Polycrystalline Silicon During Rapid Thermal Annealing," S.R. Wilson, W.M. Paulson. R.B. Gregory, J.D. Gressett, A.H. Hamdi, and F.D. McDaniel, Applied Physics Letters 45, 464 (1984).
 
  91. "Properties of Ion Implanted Polycrystalline Si Layers Sub­jected to Rapid Thermal Annealing," S.R. Wilson, R.B. Gregory, W.M. Paulson, S.J. Krause, J.D. Gressett, A.H. Hamdi, F.D. McDaniel, and R.G. Downing, Journal of Electrochemical Society 132, 922 (1985).
 
  92. "L‑Shell X‑Ray Production Cross Sections of Ni, Cu, Ge, As, Rb, Sr, Y, Zr, and Pd by 0.25‑2.5 MeV Protons," J.L. Duggan, P.M. Kocur, J.L. Price, F.D. McDaniel, R. Mehta, and G. Lapicki, Phys. Rev. A32, 2088 (1985).
 
  93.

 

"Multiple Outer‑Shell Ionization Effect in Inner‑Shell X‑Ray Production," G. Lapicki, R. Mehta, J.L. Duggan, P.M. Kocur, J.L. Price, and F.D. McDaniel, Phys. Rev. A34, 3813 (1986).
 
  94.

 

"K‑Shell X‑Ray Production by 0.5‑2.5 MeV eq \O() Be+ Ions Incident Upon Selected Elements From Fluorine to Potassium," J.L. Price, J.L. Duggan, F.D. McDaniel, G. Lapicki, and R. Mehta, Phys. Rev. A34, 2830 (1986).
 
  95. "Carbon K-Shell X-Ray and Auger-Electron Production in Hydrocarbons and Carbon Oxides by 0.6 to 2.0 MeV Protons," R.P. Bhalla, F.D. McDaniel, and G. Lapicki, Phys. Rev. A35, 3655 (1987).
 
  96. "L- and M-Shell X-Ray Production Cross Sections of Nd, Gd, Ho, Yb, Au, and Pb by 25-MeV Carbon and 32-MeV Oxygen Ions," M.C. Andrews, F.D. McDaniel, J.L. Duggan, P.D. Miller, P.L. Pepmiller, H.F. Krause, T.M. Rosseel, L.A. Rayburn, R. Mehta, and G. Lapicki, Phys. Rev. A36, 3699 (1987).
 
  97. "M-Shell X-Ray Production Cross Sections for 0.5 to 2.5 MeV Be+ Ions Incident Upon Selected Elements from Praseodymium to Bismuth," J.L. Price, J.L. Duggan, F.D. McDaniel, G. Lapicki, and R. Mehta, Phys. Rev. A37, 365 (1988).
 
  98. "K-Shell X-Ray Production Cross Sections in 6C, 8O, 9F, 11Na, 12Mg, and 13Al by 0.75 to 4.5 MeV Protons," Y.C. Yu, M.R. McNeir, D.L. Weathers, J.L. Duggan, F.D. McDaniel, and G. Lapicki, Phys. Rev. A44, 5702 (1991).
 
  99. "L-Shell X-Ray Production Cross Sections in 26Fe, 28Ni, 29Cu, 30Zn, 31Ga, and 32Ge by 0.5 to 5.0 MeV Protons," M.R. McNeir, Y.C. Yu, D.L. Weathers, J.L. Duggan, F.D. McDaniel, and G. Lapicki, Phys. Rev. A44, 4372 (1991).
 
  100. "K-Shell X-Ray Production Cross Sections in 6C, 8O, 9F, 11Na, 12Mg, and 13Al by 0.5 to 8.0 MeV Helium Ions," Y.C. Yu, M.R. McNeir, D.L. Weathers, J.L. Duggan, F.D. McDaniel, D.K. Marble, Z.Y. Zhao, and G. Lapicki, Phys. Rev. A44, 7252 (1991).
 
  101. "L-Shell X-Ray Production Cross Sections in 26Fe, 28Ni, 29Cu, 30Zn, 31Ga, and 32Ge by 0.5 to 8.0 MeV Helium Ions," M.R. McNeir, Y.C. Yu, D.L. Weathers, D.K. Marble, Z. Zhao, J.L. Duggan, F.D. McDaniel, and G. Lapicki, J. Physics B: At. Mol. Opt. Phys. 27, 5295 (1994).
 
  102. "Fabrication of Silicon-Based Optical Components for an Ultraclean Accelerator Mass Spectrometry Negative Ion Source," J.F. Kirchhoff, D.K. Marble, D.L. Weathers, F.D. McDaniel, S. Matteson, J.M. Anthony, R.L. Beavers, and T.J. Bennett, Rev. Scien. Instrum. 65, 1570 (1994).
 
  103. "Z1 oscillations of the mean charge state for isotachic ions in carbon foils," A.M. Arrale, J. Jin, Z.Y. Zhao, D.L. Weathers, F.D. McDaniel and S. Matteson, Phys. Rev. A51, 3355-3357 (1995).
 
  104. "Charge state dependence of M-shell X-ray production in 67Ho by 2-12 MeV carbon ions," Y.C. Yu, H.L. Sun, J.L. Duggan, F.D. McDaniel, J.Y. Jin, and G. Lapicki, Phys Rev. A. 52, 3836-3846 (1995).
 
  105. "L-shell x-ray production by 2-12 carbon ions in fifteen selected elements from copper to lead," R. Mehta, H.L. Sun, D.K. Marble, J.L. Duggan, F.D. McDaniel, and G. Lapicki, J. Phys. B: At. Mol. Opt. Phys. 28, 1187-1200 (1995).
 
  106. "Charge-state dependence of K-shell x-ray production in aluminum by 2-12 MeV carbon ions," H.L. Sun, Y.C. Yu, E.K. Lin, C.W. Wang, J.L. Duggan, A.R. Azordegan, F.D. McDaniel, and G. Lapicki, Phys. Rev. A53, 4190-4197 (1996).
 
  107. "Charge state dependence of copper L-shell x-ray production by 4-14 MeV oxygen ions," A.R. Azordegan, H.L. Sun, Y.C. Yu, J.L. Duggan, F.D. McDaniel, E.K. Lin, C.W. Wang, and G. Lapicki, J. Phys. B: At. Mol. Opt. Phys. 30, 353-364 (1997).
 
  108. "Simultaneous Measurement of the Average Ion-Induced Electron Emission Yield and the Mean Charge State for Isotachic Ions in Carbon Foils," A.M. Arrale, Z.Y. Zhao, J.F. Kirchhoff, D.L. Weathers, F.D. McDaniel, and S. Matteson, Phys. Rev. A55, 1119-1123 (1997).
 
  109. "Experimental evidence for a discrete transition to channeling for 1.0 MeV protons in <100> Si," Z.Y. Zhao, A.M. Arrale, S.L. Li, D.K. Marble, D.L. Weathers, S. Matteson, J.M. Anthony, B. Gnade, and F.D. McDaniel, Phys. Rev. A57, 2742-2745 (1998).
 
  110. "Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry (TEAMS)," F.D. McDaniel, S.A. Datar, B.N. Guo, S.N. Renfrow, Z.Y. Zhao, and J.M. Anthony, Appl.Phys. Lett. 72, 3008-3010 (1998).
 
  111. "Advanced research for the diagnosis of cancers using microbeam PIXE: analysis of macro- and trace-elements in malignant tumors," D. Necsoiu, F.D. McDaniel, and J.L. Duggan, Romanian J. of Optoelectronics 6, 9-15 (1998).
 
  112. "Electronic ion energy loss calculations on the basis of the binary encounter approximation," C.A. Ordonez, D.R. Bickel, V.C. Venezia, F.D. McDaniel, S.E. Matteson, and M.I. Molina, J. of Nucl. Matl. 264,133-140 (1999).
 
  113. "High sensitivity measurements of implanted As in the presence of Ge in GexSi1-x/Si layered alloys using trace element accelerator mass spectrometry," S.A. Datar, L. Wu, B.N. Guo, M. Nigam, D. Necsoiu, Y.J. Zhai, D.E. Smith, C. Yang, M.El Bouanani, J.J. Lee, and F.D. McDaniel, Appl. Phys. Lett. 77, 3974-3976 (2000).
 
  114. "Monte Carlo simulations and experimental studies of yttrium-90 production using a 33 MeV linac," D. Necsoiu, I.L. Morgan, H. Hupf, W.J. Courtney, J. Kinross-Wright, M. El Bouanani, J.L. Duggan, and F.D. McDaniel, Applied Radiation and Isotopes 57 (2002) 509-515.
 
  115. "Ion beam analysis of carbon nanotubes," F.U. Naab, O.W. Holland, J.L. Duggan, and F.D. McDaniel, J. Phys. Chem. B109 (2005) 1415-1419.
 
  116. "Analysis of the accuracy of several methods for determining the concentration of 11B+ implanted silicon," J.L. Duggan, F.U. Naab, K. Hossain, O.W. Holland, F.D. McDaniel, J.J. Xu, Z.Y. Zhao, B.N. Guo, J. Liu, K.H. Shim, and U. Jeong, Nucl. Instrum. and Methods in Physics Research B243 (2006) 205-210.
 
  117.

"Leaf elemental analysis in mycorrihizal post oak seedlings," B.C. Boling, F.U. Naab, D. Smith, J.L. Duggan, F.D. McDaniel, Nucl. Instrum. and Methods in Physics Research B251 (2006) 182-190.
 

  118. "Direct measurement of hydrogen absorption in carbon nanotubes/nanofibers by elastic recoil detection," F. Naab, M. Dhoubhadel, J.R. Gilbert, M.C. Gilbert, L.K. Savage, O.W. Holland, J.L. Duggan, F.D. McDaniel, Physics Letters A356 (2006) 152-155.
 
  119. "The loss of boron in ultra-shallow boron implanted Si under heavy ion irradiation," P. Pelicon, M. El Bouanani, G.V. Ravi Prasad, A. Razpet, J. Simcic, B.N. Guo, D. Birt, J.L. Duggan, F.D. McDaniel, Radiation Effects and Defects in Solids, 161 (2006) 487-494.
 
  120. "Strain fields around high-energy ion tracks in α-quartz," A.K. Norman, D.M. Follstaedt, B.L. Doyle, F.D. McDaniel, J. Appl. Phys. 100 (2006) 064306-1 to -6.
 
  121. "Gallium Arsenide (GaAs) and Lead Zirconate Titanate in a microwave field," J.N. Dahiya, A. Anand, J.A. Roberts, F.D. McDaniel, Inter. J. of Microwave and Optical Technology 1 (2006) 506-510.
 
  122. "Elemental mapping of a post oak leaf using a proton microprobe," F.U. Naab, F.D. McDaniel, J.L. Duggan, B.C. Boling, D. Smith, Inter. J. of PIXE Vol. 17, Issue 3/4 (2007).
 
  123. "Spontaneous coordinated activity in cultured networks: analysis of multiple ignition sites, primary circuits, and burst phase delay distributions," M. Ham, L. Bettencourt, F. D. McDaniel, G. Gross, accepted for publication in J. Comput. Neurosci.
 
  124. "Carbon-based nanocrystal formation using low energy carbon ion implantation into silica," L. J. Mitchell, O. W. Holland, A. Neogi, F. U. Naab, L. C. Phinney, T. H. Lee, M. Kim, B. Gnade, F. D. McDaniel, submitted to Nanoscience Letters.
 
Conference Proceedings, Refereed:
  125. "Spin Assignments to Levels in 92Zr and 94Zr from (n,n'γ) Reactions," G.P. Glasgow, F.D. McDaniel. J. D. Brandenberger, J.L. Weil, and M.T. McEllistrem, Proc. Inter. Conf. on Nuclear Structure and Spectroscopy, Amsterdam, September 9-13, 1974, Edited by H.P. Blok and A.E.L. Dieperink (Scholar's Press, Nieuve Herengracht 31, Amsterdam, The Netherlands, 1974), p. 91.
 
  126. "K-Shell X-Ray Production Cross Sections of Selected Elements Al to Ni for 4.0 to 38.0 MeV 10B Ions," G. Monigold, F.D. McDaniel, J.L. Duggan, R. Mehta, R. Rice, and P.D. Miller, Proc. Fourth International Conference on Applications of Small Accelerators, Denton, Texas, October 25-27, 1976; Edited by J.L. Duggan, and I.L. Morgan (IEEE Technical Publications, Conf. Record Number 76CH1175-9 NPS, NY 1977) p. 70.
 
  127. "K-Shell X-Ray Production Cross Sections of Selected Elements from Nb through Gd for Incident Protons and Alphas from 0.6 to 2.4 MeV Steps," S.R. Wilson, J.R. Rowe, J.L. Duggan, and F.D. McDaniel, Proc. Fourth International Conference on Applications of Small Accelerators, Denton, Texas, October 25-27, 1976; edited by J.L. Duggan and I.L. Morgan (IEEE Technical Publications, Conf. Record Number 76CH1175-9 NPS; NY 1977) p. 186.
 
  128. "Production of L- X Rays by 9.5 to 41.8 MeV Fluorine Ions Incident on Six Elements from Pr to Bi," K.A. Kuenhold, J.L. Duggan, F.D. McDaniel, A.D. Ray, A. Zander, and P.D. Miller, Proc. Fourth International Conference on Applications of Small Accelerators, Denton, TX October 25-27, 1976; edited by J.L. Duggan and I.L. Morgan (IEEE Technical Publications, Conf. Record Number 76CH1175-9 NPS, NY, 1977), p. 334.
 
  129. "Projectile Charge State Dependence of Target Lα X-Ray Production," A. Toten, F.D. McDaniel, R.S. Peterson, J.L. Duggan, S.R. Wilson, J.D. Gressett, P.D. Miller, and G. Lapicki, IEEE Transations on Nuclear Science, NS-26, No. 1, p. 1143 (1979).
 
  130. "L-Shell X-Ray Production of Ga, As, Se, Br, and Cs by 0.4-2.4 MeV 1H and 4He Ions," T.M Button, R.K. Rice, J.L. Duggan, and F.D. McDaniel, IEEE Transactions on Nuclear Science, NS-26, No. 1, p. 1139 (1979).
 
  131. "MO X-Ray Production in Collisions of 9F with 10Ne," R.S. Peterson, F.D. McDaniel, J.L. Duggan, R.S. Thoe, and P.D. Miller, IEEE Transactions on Nuclear Science NS-26, No. 1, p. 1159 (1979).
 
  132. "Plane Wave Born Approximation Calculations of Cross sections for Direct Ionization of M-Subshells by Bare Charged Particles and the Subsequent Emission of M-Shell X-Rays," D.E. Johnson, F. D. McDaniel, and G. Basbas, IEEE Transactions on Nuclear Science NS-26, No. 1, p. 1162 (1979).
 
  133. "Radiative Electron Capture X-Ray Profiles from Fast Collisions of F+q with Ne," T.M. Button, R.S. Peterson, F.D. McDaniel, A. Toten, M.C. Andrews III, R. Rice, J.D. Gressett, J.L. Duggan, R.S. Thoe, G.D. Alton, and P.D. Miller, IEEE Transactions on Nuclear Science NS-26, No. 1, p. 1157 (1979).
 
  134. "K-Shell X-Ray Production of Na, Mg, Al, P, S, and Cl by 0.4-2.4 MeV H and He Ions," R.K. Rice, T.M. Button, J.L. Duggan, and F.D. McDaniel, IEEE Transactions on Nuclear Science NS-26, No. 1, p. 1150 (1979).
 
  135. "Origin and Limitation of Universal Nature of Direct Ionization of Atoms," G. Babas, R. Rice, and F.D. McDaniel, IEEE Transactions on Nuclear Science NS-26, No. 1, p. 1177 (1979).
 
  136. "Neutron Scattering Cross Sections from (n,n') and (n,n'γ) Methods - Comparison," F.D. McDaniel, G.P. Glasgow, and M.T. McEllistrem, Proceedings of the International Conference on Nuclear Cross Sections for Technology, Knoxville, TN, October 22-26, 1979, edited by J.L. Fowler, C.H. Johnson, and C.D. Bowman (NBS Special Publications 594, Gaithersburg, MD 1980) p. 135.
 
  137. "12C+n Polarization Measurements and the Carbon Standard," J.L. Weil, T.W. Burrows, and F.D. McDaniel, Proceedings of the International Conference on Nuclear Cross Sections for Technology, Knoxville, TN, October 22-26, 1979, edited by J.L. Fowler, C.H. Johnson, and C.D. Bowman (NBS Special Publication 594, Gaithersburg, MD, 1980) p. 985.
 
  138. "K-Shell Ionization by Low-Velocity Ions," R.K. Rice, F.D. McDaniel, G. Basbas, and J.L. Duggan, IEEE Transactions on Nuclear Science, NS-28, No. 2, part 2, 1103 (1981).
 
  139. "Projectile Charge State Dependence of M-Shell Ionization of Au, Pb, Bi, and U by 1.42 MeV/amu Fluorine Ions," R. Mehta, J.L. Duggan, F.D. McDaniel, M.C. Andrews, R.M. Wheeler, R.P. Chaturvedi, P.D. Miller and G. Lapicki, IEEE Transactions on Nuclear Science NS-28, No. 2, Part 2, 1122 (1981).
 
  140. "L-Shell Ionization in High-Z Targets by Carbon and Silicon Ions," P. Vengopala Rao, R.G. Albridge, A.V. Ramayya, M.C. Andrews, R. Mehta, F.D. McDaniel, and P.D. Miller, IEEE Transactions on Nuclear Science, NS-28, No. 2, Part 2, 1112 (1981).
 
  141. "An Electron-Optical System for the Efficient Operation of a Constant Energy Mode π/4 Electrostatic Parallel Plate Electron analyzer," A. Toten, F. Breyer, A.H. Hamdi, R.P. Bhalla and F.D. McDaniel, IEEE Transactions on Nuclear Science, NS-28, No. 2, Part 2, 1567 (1981).
 
  142. "Thickness Measurement Methods for thin Multilayer Metal Films," G.M. Light, G.P. Singh, and F.D. McDaniel, Proceedings 26th National Symposium of the Society for the Advancement of Material and Process Engineering, Los Angeles, CA, April 28-30, 1981, Volume 26, p. 145 (1981).
 
  143. "Experimental Methods for Thickness Measurement of Thin Metal Layers," G.M. Light, G.P. Singh, and F.D. McDaniel, Proceedings of the XIII Symposium of Non-Destructive Evaluation, April 21-23, 1981, San Antonio, TX, Vol. 13, p. 259-265 (1981).
 
  144. "Thickness Measurement Methods for Thin Metal Films," G.M. Light, G.P. Smith, and F.D. McDaniel, Proceedings of the VII Inter-American Conference on Materials Technology, Oct. 19-23, 1981, Mexico City, Mexico, Vol. 7, p. 349 (1981).
 
  145. "Novel SOI-CMOS Design with Ultra-Thin Near-Intrinsic Substrate," S.D.S. Malhi, H.W. Lam, R.F. Pinizzotto, A.H. Hamdi, and F.D. McDaniel, Proceedings of the International Electron Devices Meeting Technical Digest, Washington, DC, Dec., 1982, p. 107.
 
  146. "Isothermal Annealing of Ion Implanted Silicon with a Graphite Radiation Source," S.R. Wilson, R.B. Gregory, W.M. Paulson, A.H. Hamdi, and F.D. McDaniel, Laser-Solid Interactions and Transient Thermal Processing of Materials, edited by J. Narayan, W.L. Brown, and R.A. Lemons (North Holland, New York, 1983) p. 369.
 
  147. "Effects of Low Temperature Annealing of B+ + Si+ or BF + Si+ Implanted Silicon," S.R. Wilson, R.B. Gregory, W.M. Paulson, H.T. Diehl, A.H. Hamdi, and F. D McDaniel, IEEE Transactions on Nuclear Science NS-30, 1730 (1983).
 
  148. "Characterization of Ion Implanted Silicon Annealed with a Graphite Radiation source," S.R. Wilson, R.B. Gregory, W.M. Paulson, H.T. Diehl, A.H. Hamdi, and F.D. McDaniel, IEEE Transactions on Nuclear Science, NS-30, 1734 (1983).
 
  149. "VLSI Materials: A Comparison Between Buried Oxide SOI and SOS," A.H. Hamdi, F.D. McDaniel, R.F. Pinizzotto, S. Matteson, H. W. Lam, and S.D.S. Malhi, IEEE Transactions on Nuclear Science NS-30, 1722 (1983).
 
  150. "As Migration During PtSi Formation," A.H. Hamdi, F.D. McDaniel, and S.R. Wilson, IEEE Transactions on Nuclear Science NS-30, 1738 (1983)
 
  151. "M-Shell X-Ray Production Cross Sections for 19 Elements in the Range Z=54-92 by H+ and He+,++ Ions from 300 keV to 40 MeV," R. Mehta, J.L. Duggan, F.D. McDaniel, P.M. Kocur, J.L. Price, and G. Lapicki, IEEE Transactions on Nuclear Science NS-30, 950 (1983).
 
  152. "Electron Capture in M-Shell X-Ray Production From Heavy Elements by 25 and 35 MeV Fluorine Ions," R. Mehta, J.L. Duggan, F.D. McDaniel, M.C. Andrews, G. Lapicki, P.D. Miller, L.A. Rayburn, and A.R. Zander, IEEE Transactions on Nuclear Science NS-30, 906 (1983).
 
  153. "Preparation of Relatively Clean Carbon Backings Used in Cahrged Particle Induced X-Ray Studies for X-Rays Below 4 keV," P.M. Kocur, J.L. Duggan, R. Mehta, J. Robbins, and F.D. McDaniel, IEEE Transactions on Nuclear Sciences NS-30, 1580 (1983).
 
  154. "Implications of Heavy-Ion Induced Satellite X-Ray Emission III: Chemical Effects in High Resolution Sulfur Kα X-Ray Spectra," C.R. Vane, L.D. Hulett, Jr., S.Kahane, F.D. McDaniel, W.T. Milner, S. Raman, T.M. Rosseel, G.G. Slaughter, S.L. Varghese, and J.P. Young, Proc. of Third International Conference on Particle Induced X-Ray Emission (PIXE), July 18-22, 1983, Heidelberg, Nucl. Instrum. and Methods B3, 88-93 (1984).
 
  155. "Characterization of n-type Layers formed in Si by Ion-Implantation of Hydrogen," S.R. Wilson, W.M. Paulson, W.F. Krolikowski, D. Fathy, J.D. Gressett, A.H. Hamdi, and F.D. McDaniel, Proceedings of the Materials Research Society Symposium, Ion Implantation and Ion Beam Processing of Materials, ed. by G-K Hubler, O.W. Holland, C.R. Clayton, and C.W. White (North Holland, NY, 1984), p. 287.
 
  156. "M-Shell Electron Capture and Direct Ionization of Gold by 25-MeV Carbon and 32 MeV Oxygen Ions," M.C. Andrews, F.D. McDaniel, J.L. Duggan, P.D. Miller, P.L. Pepmiller, H.F. Krause, T.M. Rosseel, L.A. Rayburn, R. Mehta, and G. Lapicki, Nucl. Instrum. and Methods in Physics Research B10/11, 186 (1985).
 
  157. "K-K Electron Capture Cross Sections for 0.4 to 1.5 MeV H+ and 1.0 to 2.0 MeV He+ Projectiles Incident on Gaseous CH4 Targets," A. Toten, F.D. McDaniel, and G. Lapicki, Nucl. Instrum. and Methods in Physics Research B10/11, 150 (1985).
 
  158. "L-Shell X-Ray Production Cross Sections in Nd, Gd, Ho, Yb, Au, and Pb for 25 MeV Carbon and 32 MeV Oxygen Ions," M.C. Andrews, F.D. McDaniel, J.L. Duggan, R. Mehta, G. Lapicki, P.D. Miller, P.L. Pepmiller, H.F. Krause, T.M. Rosseel, and L.A. Rayburn, Nucl. Instrum. and Methods in Physics Research B10/11, 181 (1985).
 
  159. "L-Shell X-Ray Production Cross Sections for 0.5 to 2.5 MeV Be Ions Incident Upon Selected Elements from Z2 = 29 to 47," J.L. Price, J.L. Duggan, F.D. McDaniel, G. Lapicki, and R. Mehta, Nucl. Instrum. and Methods in Physics Research B24/25, 85 (1987).
 
  160. "Carbon K-Shell X-Ray and Auger-electron Cross Sections and Fluorescence yields in Benzene Bombarded by 0.6 to 2.0 MeV Protons," R.P. Bhalla, F.D. McDaniel, and G. Lapicki, Nucl. Instrum. and Methods in Physics Research B24/25, 180 (1987).
 
  161. "Accelerator Mass Spectrometry at the University of North Texas," J.M. Anthony, S. Matteson, F.D. McDaniel, and J.L. Duggan, Nucl. Instrum. and Methods in Physics Research B40/41, 731 (1989).
 
  162. "A High Resolution Electrostatic Analyzer for Accelerator Mass Spectrometry," S. Matteson, F.D. McDaniel, J.L. Duggan, J.M. Anthony, T.J. Bennett, and R.L. Beavers, Nucl. Instrum. and Methods in Physics Research B40/41, 759 (1989).
 
  163. "L-Shell X-Ray Production in Copper, Germanium, Rubidium, Strontium, and Yttrium by 100-225 keVProtons," D.K. Marble, J.D. Gressett, F.D. McDaniel, J.L. Duggan, J.F. Culwell and G. Lapicki, Nucl. Instrum. and Methods in Physics Research B40/41, 98 (1989).
 
  164. "M-Shell X-Ray Production in Gold, Lead, Bismuth, Thorium, and Uranium by 70-200 keV Protons," J.D. Gressett, D.K. Marble, F.D. McDaniel, J.L. Duggan, J.F. Culwell, and G. Lapicki, Nucl. Instrum. and Methods in Physics Research B40/41, 116 (1989).
 
  165. "Computer Automation of an Accelerator Mass Spectrometry System," J.D. Gressett, D.L. Maxson, S. Matteson, F.D. McDaniel, J.L. Duggan, H.J. Mackey, and J.M Anthrony, Nucl. Instrum. and Methods in Physics Research B40/41, 755 (1989).
 
  166. "Molecular Dissociation in Accelerator Mass Spectrometry for Trace Impurity Characterization in Electronic Materials," F.D. McDaniel, S. Matteson, D.K. Marble, L.S. Hodges, A.M. Arrale, J.Y. Hajsaleh, M.R. McNeir, J.L. Duggan, and J.M. Anthony, Proceedings of the High Energy and Heavy Ion Beams in Materials Analysis Workshop, Albuquerque, NM, June 14-16, 1989, Ed. by J.R. Tesmer, C.J. Maggiore, M. Nastasi, J.C. Barbour, and J.W. Mayer (Materials Research Society, Pittsburgh, PA, 1990) p. 269.
 
  167. "Molecular-Interference-Free Accelerator Mass Spectrometry," S. Matteson, D.K. Marble, L.S. Hodges, J.Y. Hajsaleh, A.M. Arrale, M.R. McNeir, J.L. Duggan, F.D. McDaniel, and J.M. Anthony, Proceedings of the Ninth International Conference on the Ion Beam Analysis, Queen's University, Kingston, Ontario, Canada, June 26-30, 1989, Nucl. Instrum. and Methods in Physics Research B45, 575 (1990).
 
  168. "Atomic Mass Spectrometry of Materials," J.M Anthony, S. Matteson, J.L Duggan, P.S. Elliott, D.K. Marble, F.D. McDaniel, and D.L. Weathers, Proceedings of the Fifth International Conference on Accelerator Mass Spectrometry, Paris, April 23-27, 1990, Ed. by F. Yiou and G.M. Raisbeck, Nucl. Instrum. and Methods in Physics Research B52, 493 (1990).
 
  169. "An Ultra-Clean Micrprobe Ion Source for Atomic Mass Spectrometry," S. Matteson, J.L. Duggan, D.K. Marble, F.D. McDaniel, D.L. Weathers, D.K. Wilson, J.M. Anthony, and R.L. Beavers, Proceedings of the Fifth Internationa Conference on Accelerator Mass Spectrometry, Paris, April 23-27, 1990, Ed. by F. Yiou and G.M. Raisbeck, Nucl. Instrum. and Methods in Physics Research B52, 327 (1990).
 
  170. "The University of North Texas Atomic Mass Spectrometry Facility for Detection of Impurities in Electronic Materials," F.D. McDaniel, S. Matteson, D.L. Weathers, D.K. Marble, J.L. Duggan, P.S. Elliott, D.K. Wilson, and J.M. Anthony, Proceedings of the Fifth International Conference on Accelerator Mass Spectrometry, Paris, April 23-27, 1990, Ed. by F. Yiou and G.M. Raisbeck, Nucl. Instrum. and Methods in Physics Research B52, 310 (1990).
 
  171. "K-Shell X-Ray Production Cross Sections 6C, 8O, 9F, 11Na, 12Mg and 13Al for 0.75 to 5 MeV 7Li+ Ions," Y.C. Yu, M.R. McNeir, D.L. Weathers, D.K. Marble, J.L.