SIRIS: Project Description

Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS) is a technique for analyzing materials through selective resonant ionization of sputtered neutral particles. The technique and its features are summarized below.

Technique

  • Sputter sample with ion beam
  • Resonantly excite and photoionize sputtered neutral atoms using tunable lasers
  • Accelerate and analyze photoions

Features

  • Measures dominant component of sputtered flux
  • Resonant step makes technique highly species selective
  • Insensitive to matrix effects
  • High surface sensitivity

 

|IBMAL Lab|| Department of Physics || College of Arts and Sciences || University of North Texas |